Scanning Electron Microscope (SEM)
Scanning Electron Microscope (SEM) for imaging of bulk specimens.
AMRay 1820 — has a resolution of 5 nm, a magnification range of 20 – 150,000X and an accelerating voltage range of 100 V to 30 kV. Its specimen stage is a eucentric goniometer, meaning that the specimen can be tilted and rotated about the viewing axis. Dynamic focusing accommodates imaging flat specimens. Image capture is fully digital using an iXRF digital-capture system. The microscope is fitted with a high-performance Robinson backscatter detector in addition to the standard secondary electron detector.